Surface and Thin Film Analysis - A Compendium of Principles, Instrumentation and ...

Sáb 31 Oct 2020 - 12:20

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Surface and Thin Film Analysis - A Compendium of Principles, Instrumentation and Applications
pdf | 16.29 MB | English | Isbn:B00DF3RUT8 | Author: Gernot Friedbacher | PAge: 352 | Year: 2011
Category:Analytic Chemistry, Materials Science, Analytic Chemistry
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Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)

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